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The 9th International Colloquium on Scanning Probe Microscopy

Condensed Program

12/6 (Thu.) 12/7 (Fri.) 12/8 (Sat.)

Session 5 (8:00-10:20) Session 9 (08:30-10:15)

08:00-08:40 S5-1 (Invited-S) 08:30-09:00 S9-1 (Invited)

08:40-09:20 S5-2 (Invited-S) 09:00-09:15 S9-2

09:20-09:35 S5-3 09:15-09:30 S9-3

09:35-09:50 S5-4 09:30-09:45 S9-4

09:50-10:05 S5-5 09:45-10:00 S9-5

10:05-10:20 S5-6 10:00-10:15 S9-6

Break (10:20-10:35) Break (10:15-10:30)

Session 6 (10:35-12:15) Session 10 (10:30-12:15)

10:35-11:15 S6-1 (Invited-S) 10:30-11:00 S10-1 (Invited)

11:15-11:30 S6-2 11:00-11:15 S10-2

11:30-11:45 S6-3 11:15-11:30 S10-3

11:45-12:00 S6-4 11:30-11:45 S10-4

12:00-12:15 S6-5 11:45-12:00 S10-5

Lunch (12:15-13:05) 12:00-12:15 S10-6

Session 7 (13:15-15:25) Closing Remark (12:15-12:30)

13:15-13:55 S7-1 (Invited-S)

Opening (14:00-14:10) 13:55-14:25 S7-2 (Invited)

Session 1 (14:10-15:20) 14:25-14:40 S7-3

14:10-14:50 S1-1 (Invited-S) 14:40-14:55 S7-4

14:50-15:20 S1-2 (Invited) 14:55-15:10 S7-5

Break (15:20-15:40) 15:10-15:25 S7-6

Session 2 (15:35-16:50) Break (15:25-15:40)

15:35-16:05 S2-1 (Invited) Session 8 (15:40-17:25)

16:05-16:35 S2-2 (Invited) 15:40-16:10 S8-1 (Invited)

16:35-16:50 S2-3 16:10-16:25 S8-2

Session 3 (16:50-17:35) 16:25-16:40 S8-3

Short Presentation by Exhibitors 16:40-16:55 S8-4

Dinner(18:00-19:20) 16:55-17:10 S8-5

Session 4 (19:30-21:30) 17:10-17:25 S8-6

Poster Session Banquet (19:00-)

1 2 3 4 5 6 7 8 9

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Resumo do Conteúdo

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The 9th International Colloquium on Scanning Probe Microscopy Condensed Program 12/6 (Thu.) 12/7 (Fri.) 12/8 (Sat.) Session 5 (8:00-10:20) Sess

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The 9th International Colloquium on Scanning Probe Microscopy 薄膜・表面物理分科会特別研究会「走査型プローブ顕微鏡（15）」 Atagawa, 2001.12.6-8 organized by Thin Film and Surf

Página 3 - ------Poster

5. Olympus Optical Corp. Ltd. (オリンパスプロマーケティング (株)) Fishing a Molecule with the Molecular Force Microscope NVB2000 6. SHIMADZU CORPORATION ((株)

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S6-1 (INVITED-S) Metal Contacts to Single Molecules Lindsay S. M. (Arizona State Univ.) S6-2 Electrical Conductance Measurement through ErSi2 Nanowire

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S8-2 Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact AFM Imaging of Molecular Thin Films T. Fukuma1, K. Umeda1

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S9-6 Local Mapping of Thermal Properties with Optical Heterodyne Force Microscopy N. Shiraishi1, M. Tomoda1, K. Inagaki1, O. V. Kolosov2 and O. B. Wri

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Poster Session (December 6, 20:00-22:00) 1. Nanofabrication Using AFM Lithography for Molecular Devices. M. Kato, M. Ishibashi, S. Heike, T. Hasizum

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19. Local Electronic Structure on TiO2 Surface under UV Light Irradiation Y. Li, Donghong Yin and M. Komiyama (Inst. Mol. Sci. NRI) 20. Nanoscale Vari

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38. Structural Phase Transition of Si(100) Clean Surface Observed below 50K S. Yoshida, O. Takeuchi, K. Hata and H. Shigekawa (Univ. of Tsukuba, CRE

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Sharp R-33STM Manual do Utilizador

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